Optical Simulations for CCD and CMOS Image Sensors

Dr. Koji Kikuchi,
Sony Corporation

Optical and electrical simulation methods have been developed to estimate device characteristics such as sensitivity, read out voltage, and noises. By using this simulation and new technologies, advanced CCDs and CMOS image sensors having cell size below 2.5 micron square are developed. Dr.Kikuchi will present the characteristics and advantages of advanced CCDs and CMOS sensors developed by Sony.